testIDEA: Test Use-Cases including real Hardware Signals

Most embed­ded appli­ca­tions run in con­junc­tion with dif­fer­ent elec­tri­cal sig­nals of exter­nal hard­ware. The rela­tion­ship between the embed­ded soft­ware and hard­ware sig­nal activ­i­ties are rel­e­vant dur­ing develop­ment, sys­tem inte­gra­tion, and test­ing.

This webi­nar dis­cuss­es and demos embed­ded soft­ware test­ing, com­bined with the analy­sis and gen­er­a­tion of hard­ware sig­nal stim­uli.

iSYS­TEM pro­vides an Ana­log-Dig­i­tal I/O (ADIO) mod­ule which extends the iSYS­TEM debug­ger hard­ware to a sig­nal gen­er­a­tion, a mea­sure­ment, and a tim­ing analy­sis tool. Using the iSYS­TEM on-tar­get test tool testIDEA, a system/integration test with cov­er­age mea­sure­ment can be cre­at­ed. Dur­ing the test exe­cu­tion, the test stim­u­lus sig­nals will be invoked. The iSYS­TEM winIDEA Trace Ana­lyz­er will cap­ture and dis­play the hard­ware sig­nals along with the pro­gram cov­er­age mea­sure­ment. Fur­ther­more, a tech­nol­o­gy called iSYS­TEM Pro­fil­er Inspec­tors, used for event-chain / tim­ing analy­sis, will be intro­duced. At the end, we will demon­strate the iSYS­TEM API for auto­mat­ed test­ing via script­ing.

Who:

Ales Kosir, Field Appli­ca­tion Engi­neer, iSYS­TEM Labs

About iSYSTEM

We empow­er embed­ded soft­ware engi­neers to do it right!

Our Blue­Box Tech­nol­o­gy stands for fast and easy micro­con­troller access via any kind of debug inter­face. Com­ple­ment­ed with inte­grat­ed develop­ment and test soft­ware winIDEA/testIDEA it pro­vides access to on-tar­get tim­ing infor­ma­tion. Embed­ded soft­ware engi­neers can review appli­ca­tion tim­ing, ana­lyze real-time oper­at­ing sys­tem states, and under­take code cov­er­age to prove that their prod­ucts do what they were built to do.